Scopus
YÖKSİS Eşleşti
Impact of thickness on optoelectronic properties of α-MoO<inf>3</inf> film photodetectors: Integrating first-principles calculations with experimental analysis
Physica B: Condensed Matter · Aralık 2023
YÖKSİS Kayıtları
Impact of thickness on optoelectronic properties of α-MoO3 film photodetectors: Integrating first-principles calculations with experimental analysis
Elsevier BV · 2023 SCI-Expanded
PROFESÖR ŞULE ATEŞ →
Makale Bilgileri
DergiPhysica B: Condensed Matter
Yayın TarihiAralık 2023
Cilt / Sayfa670
Scopus ID2-s2.0-85173233325
Özet
This study focused on investigating the optoelectronic properties of molybdenum trioxide (α-MoO3) thin films using the atomic layer deposition (ALD) technique through different cycle numbers and theoretical investigation. Initial band gap calculations using standard DFT with GGA-PBE resulted in a value of 1.19 eV, which deviated significantly from experimental measurements. The GGA + U method with Hubbard U corrections was applied for the first time to improve the accuracy. This refinement led to a more precise band gap value of 3.09 eV, closely matching previously reported experimental data. The electronic parameters of the α-MoO3 photodetector, such as ideality factor (n), barrier height (Φ0), and series resistance (Rs), were analyzed using the thermionic emission theory and confirmed by Cheung and Nord's methods. The results demonstrated that the sample deposited with 100 pulses exhibited higher photodetector performance under UV illumination, despite having a lower Rs.
Yazarlar (12)
1
Mohamed A. Mohamed
ORCID: 0000-0001-8473-8253
2
Mohamed Achehboune
ORCID: 0000-0002-7716-8085
3
Issam Boukhoubza
ORCID: 0000-0003-0088-9535
4
A. E.H. Gaballah
ORCID: 0000-0002-7837-8404
5
Mohammed Tihtih
ORCID: 0000-0001-7364-9036
6
Walid Belaid
ORCID: 0000-0001-9810-9386
7
Redouane En-nadir
ORCID: 0000-0002-5064-0028
8
Issam Derkaoui
ORCID: 0000-0002-2009-082X
9
Ahmed M. Abdelbar
ORCID: 0000-0002-5232-3368
10
Shrouk E. Zaki
11
Şule Ateş
12
Yasin Eker
Anahtar Kelimeler
Atomic layer deposition (ALD)
Density functional theory (DFT)
Hubbard U corrections
Ultrathin MoO films 3
UV optoelectronics
Kurumlar
Al-Azhar University
Cairo Egypt
Institut de Physique des Matériaux, Bucarest-Magurele
Bucarest-Magurele Romania
Laboratoire de Physique du Solide, Université Sidi Mohamed Ben Abdellah
Fez Morocco
Miskolci Egyetem
Miskolc Hungary
Namur Institute of Structured Matter
Namur Belgium
National Research Centre
Giza Egypt
Necmettin Erbakan Üniversitesi
Meram Turkey
Photometry & Radiometry Metrology Division
Giza Egypt
Selçuk Üniversitesi
Selçuklu Turkey
Solar and Space Research Department
Helwan Egypt
Metrikler
1
Atıf
12
Yazar
5
Anahtar Kelime