Scopus
YÖKSİS Eşleşti
Dielectric characterization of Al/PCBM:ZnO/p-Si structures for wide-range frequency
Bulletin of Materials Science · Aralık 2021
YÖKSİS Kayıtları
Dielectric characterization of Al/PCBM:ZnO/p-Si structures for wide-range frequency
Bulletin of Materials Science · 2021 SCI-Expanded
PROFESÖR MURAT YILDIRIM →
Makale Bilgileri
DergiBulletin of Materials Science
Yayın TarihiAralık 2021
Cilt / Sayfa44
Scopus ID2-s2.0-85100549063
Özet
The dielectric properties of the Al/PCBM:ZnO/p-Si structure were investigated using the impedance spectroscopy technique. PCBM:ZnO layer was obtained by spin coating method on the p-Si. The morphological properties of the PCBM:ZnO were investigated using atomic force microscopy. The results highlighted that PCBM:ZnO thin film has uniform surfaces. The dielectric parameters such as real and imaginary parts of the electric modulus (M′ and M″) and ac electrical conductivity (σ), dielectric constant (ε′), dielectric loss (ε″), loss tangent (tan δ) values were determined. The results of the dielectric properties of the Al/PCBM:ZnO/p-Si structures impressed voltage and frequency changing. The Al/PCBM:ZnO/p-Si structures can be regarded as a candidate for organic diode applications.
Yazarlar (4)
1
Dilber Esra Yıldız
ORCID: 0000-0003-2212-199X
2
Adem Koçyiğit
3
Mehmet Okan Erdal
4
Murat Yıldırım
Anahtar Kelimeler
Al/PCBM:ZnO/p-Si structure
dielectric constant
electric modulus
PCBM
ZnO
Kurumlar
Hitit University
Corum Turkey
Iğdır Üniversitesi
Igdir Turkey
Necmettin Erbakan Üniversitesi
Meram Turkey
Selçuk Üniversitesi
Selçuklu Turkey
Metrikler
6
Atıf
4
Yazar
5
Anahtar Kelime