Scopus Eşleşmesi Bulundu
1
Atıf
53
Cilt
2382-2397
Sayfa
🔓
Açık Erişim
Scopus Yazarları: Halit Cavusoglu, Adem Koçyiğit, Huseyin Sakalak, Murat Yıldırım, Ali Akbar Hussaini, Fatih Durmaz
Özet
In this investigation, we achieved successful deposition of nanostructured cupric oxide (CuO) thin films onto glass substrates through implementation of successive ionic layer adsorption and reaction (SILAR), all carried out at room temperature. This approach has proven to be highly efficient and yielded favorable results in terms of film quality and uniformity. A comprehensive investigation was conducted to analyze the effect of gold (Au) on the structural, morphological, optical, and electrical properties of nanocrystalline CuO thin films. The structural analysis confirmed that the films were polycrystalline, exhibiting a monoclinic crystal structure with preferential orientations along the (1¯11) and (111) planes. The estimated crystallite sizes ranged from 20.37 to 30.77 nm, indicating the nanoscale nature of the films. Scanning electron microscopy/energy-dispersive x-ray analysis (SEM/EDX) was executed to reveal the Au dopant on the surface of CuO thin films. Surface analysis revealed the presence of uniformly dispersed CuO nanostructures across the film surfaces. Through optical investigations, it was observed that the bandgap energy of the CuO thin films decreased from 1.52 to 1.45 eV with increasing Au concentration. Furthermore, the average transmittance of the films exhibited a decrease from 4.9% to 1.3% as the Au concentration increased. The electrical properties of the Al/Au:CuO/n-Si heterojunction were studied using current–voltage (I–V) measurements for various light power densities. The Al/Au:CuO/n-Si heterojunction exhibited good photodiode behavior, with 3.44 A/W responsivity and 1.58 × 1010 Jones specific detectivity for the 2% Au-doped CuO interfacial layer.
Anahtar Kelimeler (Scopus)
electrical characteristics
heterojunction
Au
SILAR
CuO thin film
Anahtar Kelimeler
electrical characteristics
heterojunction
Au
SILAR
CuO thin film
Makale Bilgileri
Dergi
Journal of Electronic Materials
ISSN
0361-5235
Yıl
2024
/ 2. ay
Cilt / Sayı
53
Makale Türü
Özgün Makale
Hakemlik
Hakemli
Endeks
SCI-Expanded
JCR Quartile
Q3
TEŞV Puanı
15,00
Yayın Dili
Türkçe
Kapsam
Uluslararası
Toplam Yazar
6 kişi
Erişim Türü
Basılı+Elektronik
Erişim Linki
Makaleye Git
Alan
Fen Bilimleri ve Matematik Temel Alanı
Fizik
Yoğun Madde Fiziği
Yarı İletkenler
Malzeme Fiziği
YÖKSİS Yazar Kaydı
Yazar Adı
ÇAVUŞOĞLU HALİT,HUSSAINI ALİ AKBAR,ŞAKALAK HÜSEYİN,KOÇYİĞİT ADEM,DURMAZ FATİH,YILDIRIM MURAT
YÖKSİS ID
8047679
Hızlı Erişim
Metrikler
Scopus Atıf
1
JCR Quartile
Q3
TEŞV Puanı
15,00
Yazar Sayısı
6