Optical absorption spectra of CuInSe2 chalcopyrite semiconductor films prepared using a two-stage technique were investigated. In addition to absorption measurements, energy-dispersive analysis of X-rays (EDAX) and X-ray diffraction measurements (XRD) were also performed. Direct bandgap energy values for the CuInSe2 films were derived from the variation of (αhv)2 with energy. All the measurements were performed on samples with various Cu/In ratios. It was determined from the absorption measurements that the materials have strong absorption at the fundamental band edge. The Eg values showed an increasing trend with decreasing Cu/In ratios.